Yuav ua li cas xaiv zoo hnub ci silicon wafer?

1. Ua ntej saib cov tsos, yuav tsum tsis muaj qhov tawg, tsis muaj qhov tsis zoo, tsis muaj qhov, tsis muaj chipping.
2. Qhov thib ob, saib cov ntsuas lub cev. Muaj ntau lub cev ntsuas, suav nrog siv lead ua orientation, siv lead ua orientation deviation, hom, thickness, sab ntev, perpendicularity thiab lwm yam. Siv cov cuab yeej ntsuas sib txuas los txiav txim siab hom, siv lead ua orientation, thiab lwm yam; siv cov cuab yeej ntsuas sib txuas los ntsuas qhov tuab, kam rau ua, sab ntev thiab kab pheeb ces kaum ntev thiab kam rau ua, perpendicularity, thiab lwm yam ntawm 5 ntsiab lus. Rau cov txheej txheem hnub ci, qhov tseem ceeb tshaj plaws yog Silicon wafer thickness thiab thickness variation (TTV), vim hais tias ntau lub hnub ci cell ntau lawm kab muaj silicon wafer thickness yuav tsum. Yog hais tias lub thickness yog qis dua qhov tsawg kawg nkaus thickness, qhov fragmentation tus nqi yuav nce, thiab cov nyiaj yuav raug pov rau hauv fragments. Tsis tas li ntawd, cov ntsiab lus ntawm carbon thiab oxygen tseem ceeb heev rau qhov zoo ntawm silicon wafers, yog li kev sim random yuav tsum tau ua. Tau kawg, ib txwm hais lus, yuav tsis muaj teeb meem nrog ob qhov ntsuas no. Yog tias muaj teeb meem, lawv yuav raug cuam tshuam ncaj qha rau hauv cov hluav taws xob tsis tau hais tom qab. Qhov taw qhia yog nyob rau hauv.
3. Thaum kawg, saib cov ntsuas hluav taws xob, feem ntau cov neeg nqa khoom tsawg lub neej thiab kev tiv thaiv. Qib ntawm silicon wafers yog txiav txim siab los ntawm ob qhov ntsuas no. Piv txwv li, cov neeg nqa khoom tsawg lub neej ntawm A-theem monocrystalline silicon wafers yuav tsum muaj ntau dua 10μs, thiab qhov resistivity yog 0-6Ω.cm.